The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 23, 2018
Filed:
Mar. 28, 2014
Nec Solution Innovators, Ltd., Koto-ku, Tokyo, JP;
Yasuyuki Ihara, Tokyo, JP;
Masashi Sugiyama, Tokyo, JP;
NEC SOLUTION INNOVATORS, LTD., Tokyo, JP;
Abstract
This invention relates to a method of analyzing a factor of an attribute based on a case sample set containing combinations of image data and attribute data associated with the image data. The attribute factor analysis method includes: a division step of dividing an image region of the image data forming each element of the case sample set into parts in a mesh shape of a predetermined sample size; a reconstruction step of reconstructing, based on the case sample set, the case sample sets for the respective parts to obtain reconstructed case sample sets; an analysis step of analyzing, for each of the reconstructed case sample sets, a dependency between an explanatory variable representing a feature value of image data on each part and an objective variable representing the attribute data, to thereby obtain an attribute factor analysis result; and a visualization step of visualizing the attribute factor analysis result to produce the visualized attribute factor analysis result.