The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 23, 2018

Filed:

Dec. 12, 2016
Applicant:

Leica Biosystems Imaging, Inc., Vista, CA (US);

Inventors:

Walter Georgescu, San Marcos, CA (US);

Kiran Saligrama, San Diego, CA (US);

Allen Olson, San Diego, CA (US);

Bharat Annaldas, Oceanside, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 19/24 (2011.01); G06K 9/62 (2006.01); G06K 9/80 (2006.01); G06T 7/11 (2017.01); G06T 7/62 (2017.01); G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
G06F 19/24 (2013.01); G06K 9/0014 (2013.01); G06K 9/62 (2013.01); G06K 9/80 (2013.01); G06T 7/11 (2017.01); G06T 7/62 (2017.01); G06K 9/00 (2013.01); G06T 2207/30024 (2013.01);
Abstract

Automatic nuclear segmentation. In an embodiment, a plurality of superpixels are determined in a digital image. For each of the superpixels, any superpixels located within a search radius from the superpixel are identified, and, for each unique local combination between the superpixel and any identified superpixels located within the search radius from the superpixel, a local score for the local combination is determined. One of a plurality of global sets of local combinations with an optimum global score is identified based on the determined local scores.


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