The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 23, 2018

Filed:

Dec. 30, 2015
Applicant:

Emc Corporation, Hopkinton, MA (US);

Inventors:

Ron Bigman, Holon, IL;

Jehuda Shemer, Kfar Saba, IL;

Amit Lieberman, Raanana, IL;

Assaf Natanzon, Tel Aviv, IL;

Yana Vaisman, Netanya, IL;

Oded Peer, Raanana, IL;

Assignee:

EMC IP Holding Company LLC, Hopkinton, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 7/00 (2006.01); G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
G06F 17/303 (2013.01); G06F 17/30318 (2013.01); G06F 17/30578 (2013.01);
Abstract

In general, the invention relates to a method and system for migrating tables in databases. The method may include calculating a first plurality of migration factors for a first set of tables in a source database using a plurality of pre-calculated factors and a first plurality of dynamically-calculated factor, where each of the first plurality of migration factors is associated with one of the first set of tables. The method may further include selecting a first table from the first set of tables to migrate based on the first plurality of migration factors; and migrating the first table to a target database.


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