The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 23, 2018

Filed:

May. 25, 2016
Applicant:

Red Hat, Inc., Raleigh, NC (US);

Inventors:

David L. Cantrell, Jr., Medford, MA (US);

Christopher E. Lumens, Merrimack, NH (US);

Assignee:

Red Hat, Inc., Raleigh, NC (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2018.01); G06F 11/36 (2006.01); G06F 8/61 (2018.01); G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3696 (2013.01); G06F 8/61 (2013.01); G06F 11/366 (2013.01); G06F 11/3664 (2013.01); G06F 17/30371 (2013.01);
Abstract

Mechanisms for recreating a first inconsistency in storage system metadata encountered by an installation module during a software installation process on a first computing device are provided. A test computing device accesses on a remote storage device inconsistent storage system metadata associated with the first computing device. The inconsistent storage system metadata includes a plurality of storage system metadata segments, location information that identifies corresponding locations of the respective storage system metadata segments on at least one storage device of the first computing device, and length information that identifies corresponding lengths of the respective storage system metadata segments. For each respective storage system metadata segment of the plurality of storage system metadata segments, the respective storage system metadata segment is stored at the corresponding location on a first test storage device of a test computing device.


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