The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 23, 2018

Filed:

May. 25, 2017
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Nitisha Jain, New Delhi, IN;

Prakash Murali, Bangalore, IN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/34 (2006.01); G06F 11/36 (2006.01); G06F 11/30 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3409 (2013.01); G06F 11/302 (2013.01); G06F 11/3604 (2013.01);
Abstract

One embodiment provides a method, including: identifying an application executing across a plurality of processors, wherein the application generates communication messages between the plurality of processors; collecting, using a profiler, a plurality of samples of the messages, wherein the plurality of samples are collected at a predetermined sampling rate and wherein the collecting comprises interrupting the execution of the application to collect a sample; determining, using an adaptive sampling technique, if the sampling rate comprises a sampling rate that is sufficiently low while meeting a predetermined quality threshold; adjusting, based upon the sampling rate not comprising a sampling rate that is sufficiently low, the sampling rate, and then collecting samples until the sampling rate comprises the sampling rate that is sufficiently low while meeting a predetermined quality threshold; and building, using the collected samples, an output performance profile of the application.


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