The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 23, 2018

Filed:

Jul. 18, 2015
Applicant:

Renesas Electronics Corporation, Kawasaki-shi, JP;

Inventor:

Naoki Mitsuishi, Kawasaki, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/07 (2006.01); G06F 11/08 (2006.01);
U.S. Cl.
CPC ...
G06F 11/0721 (2013.01); G06F 11/073 (2013.01); G06F 11/0757 (2013.01); G06F 11/0772 (2013.01); G06F 11/08 (2013.01);
Abstract

A microcomputer includes a plurality of functional blocks that exchange information with each other. A nonvolatile memory can rewrite information stored therein and first data has been written therein in advance. A central processing unit processes information read from the nonvolatile memory or writes information to the nonvolatile memory. An abnormality detecting unit detects an abnormality in exchange of data between the plurality of functional blocks. A nonvolatile memory checking unit reads the first data from the nonvolatile memory when the abnormality detecting unit has detected an abnormality, compares the first data with second data indicating the content of the first data when written to the nonvolatile memory, and detects an abnormality in the nonvolatile memory when a result of the comparison shows that the first data is not identical to the second data.


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