The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 23, 2018

Filed:

Apr. 14, 2017
Applicant:

Innophase Inc., San Diego, CA (US);

Inventor:

Nicolo Testi, San Diego, CA (US);

Assignee:

INNOPHASE INC., San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 1/12 (2006.01); G04F 10/00 (2006.01);
U.S. Cl.
CPC ...
G04F 10/005 (2013.01);
Abstract

Systems and methods are provided for converting time measurements to digital value representing phase. Such systems and methods use a ring oscillator to create a coarse measurement of the time difference between first and second rising edges of a modulated signal. A two-dimensional Vernier structure is used to create a fine resolution measurement of the error in the coarse measurement. The coarse and fine measurements are combined to calculate a digital time measurement. A digital time output is calculated as the difference in successive digital time measurements. An offset digital time output is calculated as a difference in a digital time output in relation to a carrier period offset. The offset digital time output is scaled and accumulated to calculate the integrated time signal. The integrated time signals are synchronized to the carrier frequency to output a series of final phase measurements.


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