The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 23, 2018
Filed:
May. 30, 2014
General Electric Company, Schenectady, NY (US);
Bryan David Maule, Camillus, NY (US);
Thomas Charles Ward, Auburn, NY (US);
Melissa Rose Stancato, Syracuse, NY (US);
General Electric Company, Schenectady, NY (US);
Abstract
A system includes a portable non-destructive testing (NDT) device. The NDT device includes a processor configured to receive imaging data captured via a sensor of the NDT device, cause a display of the NDT device to display an image to be analyzed based on the imaging data, and cause the display to display a graphical user interface (GUI). The GUI includes a first plurality of user-selectable objects. Each of the first plurality of user-selectable objects is configured to activate one or more monitoring functions of the NDT device. The processor is also configured to cause the display to display at least a first set of the first plurality of user-selectable objects. The first set of the first plurality of user-selectable objects is configured to substantially overlay the image. The first set of the first plurality of user-selectable objects is displayed based at least in part on an inspection state of the NDT device.