The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 23, 2018
Filed:
Aug. 05, 2016
Applicant:
Olympus Corporation, Hachioji-shi, Tokyo, JP;
Inventor:
Shingo Tamano, Tokyo, JP;
Assignee:
OLYMPUS CORPORATION, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01); G02B 21/02 (2006.01); G02B 27/00 (2006.01);
U.S. Cl.
CPC ...
G02B 21/006 (2013.01); G02B 21/025 (2013.01); G02B 27/0025 (2013.01); G02B 21/002 (2013.01); G02B 21/0024 (2013.01); G02B 21/0036 (2013.01);
Abstract
A scanning microscope includes: a varifocal lens that scans an object in an optical-axis direction of an objective; a scanner that scans the object in a direction orthogonal to the optical axis of the objective; and a controller configured to control the varifocal lens and the scanner.