The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 23, 2018
Filed:
Aug. 07, 2013
Fugro N.v., Leidschendam, NL;
James J. Reis, New Market, MD (US);
Carl Sonnier, Lafayette, LA (US);
Joe Jones, Hagerstown, MD (US);
Mark L. Sanford, Chambersburg, PA (US);
Edward Saade, Frederick, MD (US);
Fugro N.V., , NL;
Abstract
X-band and P-band synthetic aperture radars are used to simultaneously gather swaths of reflected radar data over a specific area simultaneously. The P-band is used to penetrate surface clutter that may be on the top of an ice formation as well as to penetrate an ice mass. X-band is used to map surface clutter on the top of an ice formation as well as to map the top of snow that may appear on an ice formation. Digital elevation maps of the top of the snow or ice clutter, the top of the ice, and the bottom of the ice and or ice thickness are constructed. By summing these various digital elevation maps a measurement of the thickness of sea ice can be determined. Further analysis of DEM, MAG and CRV layers provides an indication of the quality of the ice, for example cracks and pressure ridges, and its weak points.