The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 23, 2018

Filed:

Oct. 15, 2014
Applicant:

Korea University Research and Business Foundation, Seoul, KR;

Inventors:

Woo Jin Chung, Seoul, KR;

Ji Woong Kim, Seoul, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01C 3/08 (2006.01); G01S 7/48 (2006.01); G01S 17/42 (2006.01); G01S 17/93 (2006.01);
U.S. Cl.
CPC ...
G01S 7/4808 (2013.01); G01S 17/42 (2013.01); G01S 17/936 (2013.01);
Abstract

A method for evaluating the distance type of the measured distance comprises a sample extracting step for extracting a plurality of preliminary samples around a predicted pose; a reference set calculating step for calculating a reference distance set corresponding to each preliminary sample through applying each preliminary sample to a reference distance calculating algorithm which is previously registered, wherein the reference distance set comprises reference distances corresponding to each of a plurality of distance types; a distance type extracting step for extracting a distance type corresponding to each of the reference distance sets based on a smallest distance error among distance errors between each reference distance which compose the reference distance set and the measured distance; and a distance type evaluating step for evaluating a distance type of the measured distance based on the distance type which is extracted in correspondence with each reference distance set.


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