The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 23, 2018

Filed:

May. 17, 2016
Applicant:

The United States of America, As Represented BY the Secretary of the Navy, Washington, DC (US);

Inventors:

Matthew Gadlage, Bloomington, IN (US);

Adam Duncan, Bloomington, IN (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 27/28 (2006.01); G01R 31/303 (2006.01); G01R 31/319 (2006.01); G11C 29/56 (2006.01); G01R 31/302 (2006.01); G01R 31/317 (2006.01); G06F 13/36 (2006.01); G06F 13/40 (2006.01); G06F 13/42 (2006.01); G11C 11/412 (2006.01); G11C 29/50 (2006.01);
U.S. Cl.
CPC ...
G01R 31/303 (2013.01); G01R 31/302 (2013.01); G01R 31/31725 (2013.01); G01R 31/31907 (2013.01); G06F 13/36 (2013.01); G06F 13/4068 (2013.01); G06F 13/4282 (2013.01); G11C 29/56 (2013.01); G11C 11/4125 (2013.01); G11C 2029/5002 (2013.01);
Abstract

A highly flexible, compact, lightweight, and portable testing system for use with radiation testing activities. The testing system is coupled to a device under test (DUT), which can be positioned in such a way that the top of the die package is exposed to the direct ion beam during radiation testing. A variety of sensors, onboard memory systems, programmable interfaces, onboard control systems, data output devices, and different types of interfaces are also provided which provide an ability to perform testing procedures while having a maximum ability to orient the DUT and perform a wide variety of testing currently unavailable.


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