The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 23, 2018

Filed:

May. 18, 2016
Applicant:

Fujitsu Ten Limited, Kobe-shi, Hyogo, JP;

Inventors:

Masayoshi Kume, Kobe, JP;

Keisuke Kido, Kobe, JP;

Assignee:

FUJITSU TEN LIMITED, Kobe-shi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/40 (2014.01); G01R 31/02 (2006.01); H03K 5/08 (2006.01); G01R 31/44 (2006.01);
U.S. Cl.
CPC ...
G01R 31/025 (2013.01); G01R 31/40 (2013.01); G01R 31/44 (2013.01); H03K 5/08 (2013.01);
Abstract

There is provided an abnormality detecting circuit. A clamp unit is configured to clamp an output voltage which is output from another device, such that the upper limit of the output voltage becomes a first clamp voltage which is generated on the basis of a constant voltage generated from a power supply voltage, or a second clamp voltage which is generated on the basis of the power supply voltage and which varies depending on the power supply voltage. A short-to-power detection unit is configured to compare the output voltage clamped by the clamp unit, with a predetermined threshold value which is generated on the basis of the power supply voltage, thereby detecting occurrence of a short to power.


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