The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 23, 2018
Filed:
Jul. 31, 2017
Applicant:
University of Ottawa, Ottawa, Ontario, CA;
Inventors:
Giulio Vampa, Ottawa, CA;
Paul B. Corkum, Ottawa, CA;
Assignee:
University of Ottawa, Ottawa, Ontario, CA;
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G02F 1/37 (2006.01); G02F 1/355 (2006.01); G02F 1/35 (2006.01); G01R 29/12 (2006.01);
U.S. Cl.
CPC ...
G01R 29/12 (2013.01); G02F 1/353 (2013.01); G02F 1/3556 (2013.01); G02F 1/37 (2013.01); G02F 2001/354 (2013.01); G02F 2202/104 (2013.01); G02F 2203/10 (2013.01);
Abstract
A method and apparatus for generating high-order harmonics in a solid-state medium comprising integrated semiconductor devices and electronics. The high-order harmonics interact with and are modified by the internal electric field associated with the operation of the integrated semiconductor devices and electronics. Measurement of the high-order harmonics after modification by the internal electric fields amounts to high resolution (temporal and spatial) dynamic imaging of the internal electric fields associated with the integrated semiconductor devices and electronics.