The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 23, 2018

Filed:

Jun. 18, 2015
Applicants:

Texas Tech University System, Lubbock, TX (US);

Ramakrishna Mission Vivekananda University, West Bengal, IN;

Inventors:

David Weindorf, Lubbock, TX (US);

Somsubhra Chakraborty, West Bengal, IN;

Assignee:

TEXAS TECH UNIVERSITY SYSTEM, Lubbock, TX (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/22 (2018.01); G01N 33/24 (2006.01); G01N 21/3563 (2014.01); G01N 21/359 (2014.01); G01N 23/223 (2006.01); G01N 23/2206 (2018.01);
U.S. Cl.
CPC ...
G01N 23/2206 (2013.01); G01N 21/359 (2013.01); G01N 21/3563 (2013.01); G01N 23/223 (2013.01); G01N 33/24 (2013.01); G01N 2201/10 (2013.01); G01N 2201/12 (2013.01); G01N 2223/071 (2013.01); G01N 2223/33 (2013.01); G01N 2223/616 (2013.01);
Abstract

The present invention determines one or more properties of a soil sample by scanning a soil sample using a visible near infrared diffuse reflectance (VisNIR) spectroradiometer, scanning the soil sample using a x-ray fluorescence (PXRF) spectrometer, receiving a diffuse reflectance spectra from the VisNIR spectroradiometer and an elemental data from the PXRF spectrometer, determining one or more properties of the soil sample using one or more processors and a predictive model that relates the diffuse reflectance spectra and the elemental data to the one or more properties, and providing the one or more properties of the soil sample to one or more input/output interface.


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