The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 23, 2018
Filed:
May. 31, 2013
Method, system and computer program for determining a reflectance distribution function of an object
Applicant:
Ecole Polytechnique Federale DE Lausanne (Epfl), Lausanne, CH;
Inventors:
Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/55 (2014.01);
U.S. Cl.
CPC ...
G01N 21/55 (2013.01);
Abstract
The invention refers to a method for analyzing reflected light of an object. First a light angle distribution for a point of the object is determined. Then a plenoptic projector is controlled to illuminate the point of the object with the determined light angle distribution. Then the reflected light intensity of the point of the object is measured and the measured reflected light is analyzed in dependence of the determined light angle distribution.