The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 23, 2018

Filed:

Apr. 21, 2017
Applicants:

Commissariat À L'énergie Atomique ET Aux Énergies Alternatives, Paris, FR;

Centre National DE LA Recherche Scientifique, Paris, FR;

Inventors:

Veronica Sorgato, Quito, EC;

Michel Berger, Claix, FR;

Anne Planat-Chretien, St Egreve, FR;

Christine Vever-Bizet, Paris, FR;

Genevieve Bourg-Heckly, Paris, FR;

Charlotte Emain, Izeaux, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/55 (2014.01); G01N 21/47 (2006.01); G01N 33/483 (2006.01);
U.S. Cl.
CPC ...
G01N 21/474 (2013.01); G01N 33/4833 (2013.01); G01N 2021/4742 (2013.01); G01N 2201/088 (2013.01);
Abstract

A method and a device allow optical properties of a sample to be estimated. The method includes the illumination of the sample by a first light source, and the formation of an image of the sample thus illuminated, on the basis of which a first optical property is estimated, at various points on a surface of the sample. The method also includes measuring an auxiliary optical property of the sample and estimating the first optical property, taking account of the auxiliary optical property measured on the sample.


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