The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 23, 2018

Filed:

Jun. 16, 2015
Applicants:

University of Virginia Patent Foundation, Charlottesville, VA (US);

Brightspec, Inc., Charlottesville, VA (US);

Inventors:

Brooks Hart Pate, Charlottesville, VA (US);

Amanda Steber, Mattoon, IL (US);

Brent Harris, Charlottesville, VA (US);

Assignees:

University of Virginia Patent Foundation, Charlottesville, VA (US);

BrightSpec, Inc., Charlottesville, VA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/35 (2014.01); G01N 21/3586 (2014.01);
U.S. Cl.
CPC ...
G01N 21/3586 (2013.01); G01N 2021/3595 (2013.01);
Abstract

Apparatus and techniques for broadband Fourier transform spectroscopy can include frequency hopping spread-spectrum spectroscopy approaches. For example, an excitation source power can be spread over a specified frequency bandwidth, such as by applying a sequence of short, transform-limited pulses to a sample. Each pulse can include a specified carrier frequency, and a corresponding bandwidth of the individual pulse can be determined by a frequency domain representation when Fourier transformed. A series of short excitation pulses can be used to create an excitation sequence, such as to deliver a specified or desired amount of power to the sample, such as by having the excitation source enabled for a time comparable to a free induction decay (FID) dephasing time.


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