The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 23, 2018
Filed:
Jan. 15, 2016
Applicant:
Intertech Development Company, Skokie, IL (US);
Inventors:
David J. Balke, Morton Grove, IL (US);
Jacques E. Hoffman, Lincolnwood, IL (US);
Assignee:
InterTech Development Company, Skokie, IL (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01M 3/28 (2006.01); G01M 3/00 (2006.01);
U.S. Cl.
CPC ...
G01M 3/2876 (2013.01); G01M 3/002 (2013.01);
Abstract
Embodiments of the inventive subject matter include a method and apparatus for performing a leak test. A fluid flows through a first aperture of a product and at least a portion of the fluid is allowed to exit the product through a second aperture while the fluid is flowing through the first aperture. The second aperture is closed in response to determining that a first threshold parameter is reached. The first aperture is closed in response to determining that a second threshold parameter is met. Then, a leak test can be performed.