The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 23, 2018
Filed:
Jun. 15, 2015
Commissariat À L'énergie Atomique ET Aux Énergies Alternatives, Paris, FR;
Fabien Quere, Vélizy-Villacoublay, FR;
Valentin Gallet, Epinay sur Orge, FR;
Gustave Pariente, Paris, FR;
Abstract
A characterization method of a light beam includes separating the light beam into first and second sub-beams; propagating the first and second sub-beams over first and second optics respectively; the first sub-beam, which forms a reference beam, and the second sub-beam, which forms a characterized beam, being separated by a time delay τ; recombining the reference and characterized beams so that they spatially interfere and form a two-dimensional interference pattern; measuring the pattern to obtain a temporal interferogram; calculating the Fourier transform in the frequency domain of a spatial point of the interferogram, the Fourier transform having a frequency central peak and first and second frequency side peaks; calculating the Fourier transform in the frequency domain for the first or second time side peaks calculating the spectral amplitude and the spatial-spectral phase for the first or second frequency side peak of the Fourier transform in the frequency domain.