The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 23, 2018

Filed:

Nov. 29, 2010
Applicant:

Wilhelm Kettler, Wuppertal, DE;

Inventor:

Wilhelm Kettler, Wuppertal, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B05D 5/06 (2006.01); G01J 3/28 (2006.01); G01J 3/50 (2006.01);
U.S. Cl.
CPC ...
G01J 3/28 (2013.01); G01J 3/504 (2013.01);
Abstract

The invention relates to a method for generating calibrated color data of a target using color measurement instruments distributed in the network comprising the steps A) generating at least one standard instrument profile for the color measurement instruments distributed in the network to correct photometric and wavelength scale differences, and B) generating at least one geometry instrument profile for the color measurement instruments distributed in the network to correct geometry scale differences. The method can be used in applications where color measurement instrument networks are used, particularly in robotic systems where color measurement instruments are integrated.


Find Patent Forward Citations

Kettler, Wilhelm. (2018). Method for generating and applying instrument profiles (U.S. Patent No. 10107685). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10107685

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…