The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 23, 2018

Filed:

Sep. 09, 2013
Applicant:

Hexagon Technology Center Gmbh, Heerbrugg, CH;

Inventors:

Pascal Jordil, Ecoteaux, CH;

Bo Pettersson, London, GB;

Knut Siercks, Mörschwil, CH;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01C 3/08 (2006.01); G01B 11/00 (2006.01); B25J 9/16 (2006.01); G01B 5/00 (2006.01);
U.S. Cl.
CPC ...
G01B 11/005 (2013.01); B25J 9/1623 (2013.01); B25J 9/1697 (2013.01); G01B 5/0004 (2013.01); G05B 2219/39052 (2013.01);
Abstract

A coordinate measuring machine CMM and a method for gauging a target object by means of said CMM. The CMM comprises a Delta Robot as a support structure having an end effector movable within a motion zone, a tool-holder fixed to the end effector configured to accommodate various measurement probes and especially a camera, wherein the camera comprising an optics having a field of view encompassing maximum 20% of a motion zone of the end effector. Further it comprises a control unit controlling the motion of the end effector within the motion zone and the motion of the measurement probe over a target object in an 'on the fly'-mode. Further it comprises an analyzing unit for processing electronic signals and/or data delivered by the measurement probe. The analyzing unit comprises especially storage means for storing said images and comprising a circuit unit for processing said images.


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