Feature point matching method of planar array of four-camera group and measuring method based on the same

Abstract

A feature point matching method of a planar array of a four-camera group and a measuring method based on the feature point matching method of the planar array of the four-camera group relate to the field of optical electronic measurement. The matching method comprises determining unique matching point groups on four imaging planes corresponding to the same viewed point. For each unique matching point group, three-dimensional space coordinates of the viewed point can be calculated according to image coordinates of the matching point group and parameters of the camera system itself. Under any illumination conditions, as long as the acquired image is clear enough, for any viewed object imaged on an image of a planar array of a four-camera group and having certain image features, using completely identical matching method and measuring method can realize three-dimensional measurement of the viewed object.