The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 23, 2018

Filed:

Sep. 05, 2013
Applicant:

Smith International, Inc., Houston, TX (US);

Inventors:

Feng Yu, Lindon, UT (US);

Benjamin Randall, Spanish Fork, UT (US);

Haibo Zhang, Lindon, UT (US);

J. Daniel Belnap, Lindon, UT (US);

Assignee:

SMITH INTERNATIONAL, INC., Houston, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
E21B 10/50 (2006.01); B22F 3/15 (2006.01); C22C 26/00 (2006.01); E21B 10/573 (2006.01); E21B 10/55 (2006.01); E21B 10/46 (2006.01); B22F 5/00 (2006.01); B22F 7/06 (2006.01);
U.S. Cl.
CPC ...
E21B 10/5735 (2013.01); B22F 3/15 (2013.01); C22C 26/00 (2013.01); E21B 10/46 (2013.01); E21B 10/55 (2013.01); B22F 7/062 (2013.01); B22F 2005/001 (2013.01); B22F 2999/00 (2013.01);
Abstract

Ultra-hard constructions comprise polycrystalline diamond-body having a first metallic substrate attached thereto, and having a second metallic substrate attached to the first metallic substrate. The first and second substrates each comprise a first hard particle phase, e.g., WC, and a second binder material phase, e.g., Co, wherein the hard particles in the second substrate are sized larger than those in the first substrate. The first substrate may contain a larger amount of binder material than the second substrate. Constructed in this matter, the first substrate is engineered to facilitate sintering diamond body during HPHT conditions, while the second substrate is engineered to provide an improved degree of erosion resistance when placed in an end-use application. The construction may be formed during a single HPHT process. The second substrate may comprise 80 percent or more of the combined thickness of the first and second substrates.


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