The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 16, 2018

Filed:

Mar. 16, 2016
Applicants:

Hongfujin Precision Electronics (Zhengzhou) Co., Ltd., Zhengzhou, CN;

Hon Hai Precision Industry Co., Ltd., New Taipei, TW;

Inventors:

Yu-Ching Liu, New Taipei, TW;

Wei-Da Yang, New Taipei, TW;

Po-Lin Su, New Taipei, TW;

Jie-Peng Kang, Shenzhen, CN;

Xue-Rui Deng, Shenzhen, CN;

Liu-Ming Zhang, Shenzhen, CN;

Rui Li, Shenzhen, CN;

Su-Min Li, Shenzhen, CN;

Yong-Qiang Han, Shenzhen, CN;

Guang-Xing Wang, Shenzhen, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 24/06 (2009.01); G06F 3/0354 (2013.01); G06F 3/041 (2006.01); H04M 1/725 (2006.01); H04N 5/225 (2006.01); H04W 4/02 (2018.01); G03B 43/00 (2006.01); H04N 17/00 (2006.01); G06F 11/22 (2006.01);
U.S. Cl.
CPC ...
H04W 24/06 (2013.01); G03B 43/00 (2013.01); G06F 3/03545 (2013.01); G06F 3/0416 (2013.01); G06F 11/2221 (2013.01); H04M 1/72583 (2013.01); H04N 5/2257 (2013.01); H04N 17/002 (2013.01); H04W 4/026 (2013.01);
Abstract

A machine for testing the parts and functions of a mobile phone includes a supporting mechanism, a platform, a receiving portion, and a detecting mechanism. The supporting mechanism is mounted in a box. The platform is slidably mounted on the supporting mechanism. The receiving portion is used to receive the mobile phone. The receiving portion is rotatably mounted on the platform. Devices within the machine are operated to test the mobile phone. A mobile phone testing system used in the testing machine is also described.


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