The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 16, 2018

Filed:

Jun. 16, 2017
Applicant:

Contec, Llc, Schenectady, NY (US);

Inventors:

Ina Huh, Morgan Hill, CA (US);

Rajeev Tiwari, San Jose, CA (US);

Jin Ryu, San Jose, CA (US);

Assignee:

Contec, LLC, Schenectady, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04L 12/26 (2006.01); H04L 12/28 (2006.01);
U.S. Cl.
CPC ...
H04L 43/50 (2013.01); H04L 12/2801 (2013.01); H04L 43/12 (2013.01);
Abstract

A master test system may comprise cable modem termination systems, resource servers, provisioning/Session Initiation Protocol (SIP) servers, call management system (CMS) servers, Data over Cable Service Interface Specification/Wide Area Network (DOCSIS/WAN) servers, test controller servers, etc. Servers on the master test system may facilitate tests of devices under test (DUTs) coupled to the master test system. Servers on the master test system and/or slave test systems may facilitate tests of DUTs coupled to slave test systems that are coupled to the master test system. The slave test system(s) may comprise resource servers and test controller servers. In various implementations, the servers on the slave test system(s) may facilitate tests of DUTs coupled to the slave test system(s).


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