The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 16, 2018

Filed:

Mar. 06, 2018
Applicant:

Fujitsu Limited, Kawasaki-shi, Kanagawa, JP;

Inventor:

Takayuki Shibasaki, Kawasaki, JP;

Assignee:

FUJITSU LIMITED, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 25/06 (2006.01); H03K 5/08 (2006.01); H04L 1/20 (2006.01); H04L 25/49 (2006.01); H04B 10/69 (2013.01);
U.S. Cl.
CPC ...
H04L 25/063 (2013.01); H03K 5/086 (2013.01); H04B 10/6933 (2013.01); H04L 1/20 (2013.01); H04L 25/4917 (2013.01);
Abstract

A comparator circuit outputs a comparison result obtained by comparing a data signal with a threshold whose magnitude is adjusted based on a first offset value at a timing synchronized with a second clock signal whose phase is adjusted based on a difference in phase between the data signal and a first clock signal and a second offset value. An eye monitor circuit thins comparison results obtained in a clock data recovery (CDR) circuit for individual symbols of the data signal by comparing the data signal with a threshold, selects a comparison result corresponding to a symbol for which the comparison result is obtained by the comparator circuit, determines, by comparing the selected comparison result with the comparison result obtained by the comparator circuit, whether or not an error has occurred due to the first or second offset value, and outputs the number of times the error has occurred.


Find Patent Forward Citations

Loading…