The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 16, 2018

Filed:

Dec. 08, 2017
Applicant:

Texas Instruments Incorporated, Dallas, TX (US);

Inventors:

Viswanathan Nagarajan, Bangalore, IN;

Srinivas Kumar Reddy Naru, Markapur, IN;

Narasimhan Rajagopal, Chennai, IN;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H03M 1/10 (2006.01); H03M 13/39 (2006.01); H03M 1/12 (2006.01); H03M 13/11 (2006.01);
U.S. Cl.
CPC ...
H03M 13/39 (2013.01); H03M 1/1014 (2013.01); H03M 1/1245 (2013.01); H03M 13/1145 (2013.01);
Abstract

A pipeline ADC comprising an ADC segment and a digital backend coupled to the ADC segment. In some examples the ADC is configured to receive an analog signal, generate a first partial digital code representing a first sample of the analog signal, and generate a second partial digital code representing a second sample of the analog signal. In some examples the digital backend is configured to receive the first and second partial digital codes from the ADC segment, generate a combined digital code based at least partially on the first and second partial digital codes, determine a gain error of the ADC segment based at least partially on a first correlation of a PRBS with a difference between the first and second partial digital codes, and apply a first correction to the combined digital code based at least partially on the gain error of the ADC segment.


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