The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 16, 2018

Filed:

Apr. 15, 2016
Applicant:

SK Hynix Inc., Gyeonggi-do, KR;

Inventor:

Won-Seok Hwang, Gyeonggi-do, KR;

Assignee:

SK Hynix Inc., Gyeonggi-do, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 1/12 (2006.01); H01L 27/146 (2006.01); H03K 3/037 (2006.01); H03K 23/54 (2006.01); H03K 3/356 (2006.01); H03M 1/50 (2006.01);
U.S. Cl.
CPC ...
H01L 27/14609 (2013.01); H01L 27/14643 (2013.01); H03K 3/037 (2013.01); H03K 3/356121 (2013.01); H03K 23/54 (2013.01); H03M 1/123 (2013.01); H03M 1/50 (2013.01);
Abstract

Disclosed are a latch circuit receiving a negative output of a next stage latch circuit as a feedback input, a double data rate (DDR) ring counter based on the latch circuit to perform DDR counting of pulse periods and reduce the number of toggles, a hybrid counting device counting lower-bit portion by using the latch-based DDR ring counter and upper-bit portion by using a binary counter, and an analog-to-digital converting device and a CMOS image sensor employing the hybrid counting device. A double data rate ring counter may include a plurality of latches coupled in a ring type. The plurality of latches may include positive-edge-triggered latches and negative-edge-triggered latches arranged alternately. A current stage latch receives an output of a previous latch stage to shift to a next latch stage according to a counter clock, receives an output of the next latch stage to check a data shift to the next latch stage, and falls to a low level if the data shift is checked.


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