The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 16, 2018
Filed:
Aug. 15, 2016
Applicant:
Sandisk Technologies Llc, Plano, TX (US);
Inventors:
Philip Reusswig, Mountain View, CA (US);
Deepak Raghu, San Jose, CA (US);
Zelei Guo, San Jose, CA (US);
Chris Nga Yee Yip, Sunnyvale, CA (US);
Assignee:
SanDisk Technologies LLC, Plano, TX (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/02 (2006.01); G06F 11/07 (2006.01); G11C 29/50 (2006.01); G06F 11/14 (2006.01); G11C 11/56 (2006.01); G11C 16/26 (2006.01);
U.S. Cl.
CPC ...
G11C 29/028 (2013.01); G06F 11/076 (2013.01); G06F 11/1435 (2013.01); G11C 11/5642 (2013.01); G11C 16/26 (2013.01); G11C 29/021 (2013.01); G11C 29/50004 (2013.01); G11C 2029/5004 (2013.01);
Abstract
A storage device with a memory may utilize an optimized read retry operation. A read retry table includes a number of read retry cases with updated read thresholds. The read thresholds in the read retry table may be used to avoid errors caused by shifting of charge levels. The optimization of read retry includes weighting or reordering of the read retry cases in the read retry table. The selection of a read retry case (and corresponding read thresholds) are determined based on the weighting or reordering.