The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 16, 2018
Filed:
May. 22, 2017
Siemens Medical Solutions Usa, Inc., Malvern, PA (US);
Xing Rong, Schaumburg, IL (US);
Alexander Hans Vija, Evanston, IL (US);
Siemens Medical Solutions USA, Inc., Malvern, PA (US);
Abstract
Model-based scatter correction is used in SPECT with a non-parallel-hole collimator. Model-based scatter correction uses scatter kernels based on simulation to model the scatter for a given system and patient. For non-parallel-hole collimators, the measured sensitivity and measured vector maps are used in the modeling of scatter. The measured sensitivity is used to normalize the scatter kernels simulated for a parallel-hole collimator rather than attempting to simulate scatter with the complicated arrangement of holes. The measured vector maps are used to accurately project the model-based scatter sources into a data or emissions space.