The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 16, 2018

Filed:

Oct. 12, 2016
Applicant:

Oracle International Corporation, Redwood City, CA (US);

Inventors:

Haowei Zhang, Santa Clara, CA (US);

Xiaoying Shen, Austin, TX (US);

Sebastian Turullols, Los Altos, CA (US);

Assignee:

Oracle International Corporation, Redwood City, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01); G06F 17/11 (2006.01); G06F 17/16 (2006.01);
U.S. Cl.
CPC ...
G06F 17/5036 (2013.01); G06F 17/11 (2013.01); G06F 17/16 (2013.01); G06F 17/5009 (2013.01); G06F 17/5031 (2013.01); G06F 17/5081 (2013.01); G06F 2217/84 (2013.01); G06F 2217/86 (2013.01);
Abstract

Embodiments include systems and methods for optimization of micro-benchmark analysis for microprocessor designs. For example, embodiments seek to generate a suite of micro-benchmarks and associated weighting factors, which can be used to effectively define a weighted aggregate workload condition for a fine-grained (e.g., RTL) simulation in a manner that is a sufficient proxy for predicted commercial workload conditions. The suite of micro-benchmarks can be appreciably more efficient to simulate than the commercial workload, so that using the suite of micro-benchmarks as a proxy for the commercial workload can provide many benefits, including more efficient iterative design.


Find Patent Forward Citations

Loading…