The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 16, 2018

Filed:

Jun. 13, 2016
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Michael E. Browne, Staatsburg, NY (US);

Nnaemeka I. Emejulu, Austin, TX (US);

Andrew J. Lavery, Austin, TX (US);

Ye Liu, Belmont, MA (US);

Mario A. Maldari, Longmont, CO (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/36 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3692 (2013.01); G06F 11/3604 (2013.01); G06F 11/3676 (2013.01);
Abstract

Described are a system and method for performing an automated quality assessment on a software program under test. A test automation system executes a test on a software program Data related to the test is automatically collected. The data includes first information determined by the test automation system in response to executing the test. The data further includes second information related to the test and received from a source other than the test automation system. The first information is analyzed. A quality assessment of the software program is generated from the analyzed first information and from the second information.


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