The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 16, 2018

Filed:

May. 23, 2016
Applicant:

Amazon Technologies, Inc., Seattle, WA (US);

Inventor:

Anton Vladilenovich Goldberg, San Jose, CA (US);

Assignee:

Amazon Technologies, Inc., Seattle, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/07 (2006.01); G06N 99/00 (2010.01); G06F 9/455 (2018.01);
U.S. Cl.
CPC ...
G06F 11/079 (2013.01); G06F 9/45558 (2013.01); G06F 11/0712 (2013.01); G06F 11/0751 (2013.01); G06F 11/0787 (2013.01); G06N 99/005 (2013.01); G06F 2009/45587 (2013.01); G06F 2009/45591 (2013.01);
Abstract

A machine learning engine is configured to create a customized anomaly detector for use by a system resource, such as a virtual machine instance running specific operations. Anomalies are determined by comparing aspects of current data to 'normal' baseline data indicating a normal range of performance and operation of a system resource. Operation by a system resource that is outside of this normal range of performance and operation may be considered an anomaly. The machine learning engine may be used to create customized monitoring that detects anomalies in operation and/or performance of a system resource based on at least some custom parameters that are unique to the particular system that is to be monitored. The parameters may include operational parameters, which may be selected specifically for the system to be monitored. The parameters may also include some technical parameters which are used by many other systems to monitor hardware performance.


Find Patent Forward Citations

Loading…