The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 16, 2018

Filed:

Sep. 08, 2016
Applicant:

Apple Inc., Cupertino, CA (US);

Inventors:

Yu Cheng Chen, San Jose, CA (US);

Keitaro Yamashita, Nishinomiya, JP;

Abbas Jamshidi Roudbari, Sunnyvale, CA (US);

Hirokazu Yamagata, Adachi, JP;

Ting-Kuo Chang, San Jose, CA (US);

Assignee:

Apple Inc., Cupertino, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01L 27/12 (2006.01); G06F 3/041 (2006.01); G06F 3/044 (2006.01);
U.S. Cl.
CPC ...
G06F 3/0418 (2013.01); G06F 3/044 (2013.01); G06F 3/0412 (2013.01); H01L 27/124 (2013.01); G06F 2203/04111 (2013.01);
Abstract

Thin-film transistor circuitry for a display may include conductive layers such as transparent conductive layers and metal layers and may include dielectric layers. The dielectric layers may include buffer layers, interlayer dielectric, gate insulator, and organic planarization layers. The organic planarization layers may be patterned photolithographically to form vias, trenches, and other structures. Trenches may be formed by removing the planarization layer in a strip. When planarization material is removed for forming a trench or other structure, a step is formed in the planarization material. Metal lines such as data lines and other signal lines may cross steps in the planarization material. To prevent shorts between lines, a step may have protrusions that help eliminate metal etch residue. Vias may be reduced in depth by forming metal bumps and dielectric bumps under the vias and by forming other via structures.


Find Patent Forward Citations

Chen, Yu. (2018). Display with shallow contact holes and reduced metal residue at planarization layer steps (U.S. Patent No. 10101853). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10101853

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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