The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 16, 2018

Filed:

Jan. 22, 2016
Applicant:

Electronics and Telecommunications Research Institute, Daejeon, KR;

Inventors:

Tae One Kim, Daejeon, KR;

Hyun Eui Kim, Chungcheongbuk-do, KR;

Jae Han Kim, Gyeonggi-do, KR;

Jin Woong Kim, Daejeon, KR;

Kyung Ae Moon, Daejeon, KR;

Jin Soo Choi, Daejeon, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G03H 1/08 (2006.01); G06T 5/00 (2006.01); G03H 1/04 (2006.01); G03H 1/22 (2006.01);
U.S. Cl.
CPC ...
G03H 1/0808 (2013.01); G06T 5/006 (2013.01); G03H 2001/0491 (2013.01); G03H 2001/0825 (2013.01); G03H 2001/2247 (2013.01); G03H 2210/30 (2013.01); G03H 2210/33 (2013.01); G03H 2210/454 (2013.01); G06T 2200/04 (2013.01); G06T 2207/10028 (2013.01);
Abstract

Provided is a method and an apparatus for correcting a distortion of a three-dimensional (3D) hologram, in which the method is performed by the apparatus and includes generating a sliced two-dimensional (2D) section of a hologram by slicing the hologram while performing translation in an optical axis direction, obtaining a sharp sliced image of the hologram from a sequence of images of generated sliced 2D sections using a focusing function of a camera, and analyzing a distortion of the obtained sliced image, and using such a method and apparatus may enable correction of a distortion of a 3D hologram independently from a display structure.


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