The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 16, 2018
Filed:
Jun. 01, 2017
Lightel Technologies, Inc., Renton, WA (US);
Ge Zhou, Renton, WA (US);
Shangyuan Huang, Seattle, WA (US);
LIGHTEL TECHNOLOGIES, INC., Renton, WA (US);
Abstract
A connector inspector includes a microscope assembly, a supporting tray, and a main frame. The microscope assembly is placed within the supporting tray with a bottom cylindrical protrusion inserted into a base plate of the supporting tray, and the supporting tray is coupled with the main frame with a pair of pivoting joints. The microscope assembly is horizontally biased by a spring and an adjusting knob, both set between the main frame and the microscope assembly. The microscope assembly is vertically biased by a spring and an adjusting knob, both set between the main frame and the microscope assembly. Thus, the microscope assembly is able to swing to shift the imaging axis of the microscope assembly in two dimensions using the two adjusting knobs respectively. Because the biasing means for the imaging axis are built inside the inspector, the inspector may be used with just one hand.