The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 16, 2018

Filed:

Sep. 07, 2016
Applicant:

Silicon Laboratories Inc., Austin, TX (US);

Inventors:

Alexander Cherkassky, Hollis, NH (US);

Bruce P. Del Signore, Hollis, NH (US);

Assignee:

Silicon Laboratories Inc., Austin, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 27/00 (2006.01); A61B 5/053 (2006.01); G01N 27/04 (2006.01); G01R 25/00 (2006.01); A61B 5/00 (2006.01); G01R 27/02 (2006.01);
U.S. Cl.
CPC ...
G01R 27/00 (2013.01); A61B 5/053 (2013.01); A61B 5/0537 (2013.01); A61B 5/7278 (2013.01); G01N 27/04 (2013.01); G01R 25/005 (2013.01); G01R 27/02 (2013.01); A61B 2562/06 (2013.01);
Abstract

Embodiments of synchronous detection circuits and methods are provided for extracting magnitude and phase information from a waveform. One embodiment of a synchronous detection circuit includes a driver circuit, an analog-to-digital converter (ADC) and a controller. The driver circuit is configured to supply an input waveform at an input frequency to a load. The ADC is coupled to receive an output waveform from the load, and configured for generating four digital samples, each spaced 90° apart, for every period of the output waveform. The controller is configured for setting an oversampling rate (OSR) of the ADC, so that the ADC generates an integer number, M, of sub-samples for each digital sample generated by the ADC, where the integer number, M, of sub-samples is inversely proportional to the input frequency of the input waveform. The controller is further configured to use the digital samples generated by the ADC to extract magnitude and phase information from the output waveform.


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