The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 16, 2018

Filed:

Mar. 18, 2016
Applicant:

Shimadzu Corporation, Kyoto-shi, Kyoto, JP;

Inventor:

Masanori Fujiwara, Kyoto, JP;

Assignee:

SHIMADZU CORPORATION, Kyoto-shi, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/05 (2006.01); G01N 21/41 (2006.01); G01N 30/74 (2006.01);
U.S. Cl.
CPC ...
G01N 30/74 (2013.01); G01N 21/05 (2013.01); G01N 21/41 (2013.01); G01N 2201/061 (2013.01); G01N 2201/068 (2013.01);
Abstract

An embodiment of a refractive index detector includes a sample cell, a reference cell, a measurement section, a liquid inlet port, liquid outlet sections, and a switching mechanism. The inlet port leads to a sample cell inlet. A first outlet port and a second outlet port are for discharging a liquid. The switching mechanism includes a reference liquid supply mode for forming a channel for connecting a reference cell outlet to one of the first outlet port and the second outlet port while connecting a sample cell outlet to a reference cell inlet, and an analysis mode for forming a channel for connecting the sample cell outlet to one of the first outlet port and the second outlet port while sealing the reference cell outlet.


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