The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 16, 2018

Filed:

Mar. 03, 2015
Applicant:

Shimadzu Corporation, Kyoto-shi, Kyoto, JP;

Inventor:

Hiroshi Ohashi, Otsu, JP;

Assignee:

SHIMADZU CORPORATION, Kyoto-shi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 31/00 (2006.01); G01N 30/02 (2006.01); G01N 30/86 (2006.01); G01N 30/88 (2006.01);
U.S. Cl.
CPC ...
G01N 30/02 (2013.01); G01N 30/8658 (2013.01); G01N 2030/027 (2013.01); G01N 2030/8804 (2013.01);
Abstract

Provided is a chromatograph data processing system for presenting unexamined analysis conditions to a user in an easily understood manner when changing a plurality of analysis condition parameters. The system is used for a chromatograph for analyzing a sample according to a schedule table in which a plurality of analysis conditions and execution order of a plurality of analyses are described, each of the plurality of analysis conditions being defined by a combination of control parameter values. The system includes: memoryfor storing a plurality of analysis conditions; unexamined analysis condition creatorfor creating all combinations of values of control parameters included in the plurality of analysis conditions, and for creating a list of unexamined analysis conditions from the created combinations, the list being composed of analysis conditions that are not included in the plurality of analysis conditions stored in the memory; and display section


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