The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 16, 2018
Filed:
Jun. 29, 2015
Jinchi Zhang, Quebec, CA;
Benoit Lepage, Quebec, CA;
Jinchi Zhang, Quebec, CA;
Benoit Lepage, Quebec, CA;
Other;
Abstract
Disclosed is a calibration method and system for non-destructive testing and inspection (NDT/NDI). The method and system involve establishment of a reference database by conducting FMC acquisition on a first calibration block having standardly known indications with a first series of depths and under a laboratory standard calibration condition. Then phased-array operation is conducted on a second calibration block, which is substantially the same as the first block, having indications with a series of corresponding user measured depths and under a second calibration condition as close to the laboratory condition as possible. The calibration is then made with the gain compensation calculated based on the response signals from the indications of the second block, the first series of gain data from the reference database, and the user measured depths for the corresponding indications under the second calibration condition.