The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 16, 2018

Filed:

Aug. 27, 2014
Applicant:

Kawasaki Jukogyo Kabushiki Kaisha, Kobe-shi, Hyogo, JP;

Inventor:

Toshihiro Yamaoka, Nagoya, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 29/22 (2006.01); G01N 29/04 (2006.01); G01N 29/30 (2006.01); G01N 29/265 (2006.01); G01N 29/32 (2006.01);
U.S. Cl.
CPC ...
G01N 29/225 (2013.01); G01N 29/04 (2013.01); G01N 29/043 (2013.01); G01N 29/265 (2013.01); G01N 29/30 (2013.01); G01N 29/32 (2013.01); G01N 2291/0231 (2013.01); G01N 2291/044 (2013.01); G01N 2291/2632 (2013.01); G01N 2291/2638 (2013.01); G01N 2291/2694 (2013.01);
Abstract

An ultrasonic flaw detector includes: a flaw detection head including a probe that transmits an ultrasonic wave to an inspection object formed by a composite member and receives the ultrasonic wave that has reflected on the inspection object; a moving mechanism, which causes the flaw detection head to perform scanning; and a support mechanism disposed such that the support mechanism comes into contact with a lower surface of the inspection object, the support mechanism supporting the inspection object. The support mechanism is configured to come into contact with the inspection object over a predetermined area such that a waveform of the ultrasonic wave that has reflected on a position where the support mechanism is in contact with the inspection object and that is received by the probe is within a noise level.


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