The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 16, 2018

Filed:

Aug. 28, 2015
Applicant:

William N. Carr, Raleigh, NC (US);

Inventor:

William N. Carr, Raleigh, NC (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 27/02 (2006.01); G01R 15/14 (2006.01); G01R 29/08 (2006.01); G01N 22/00 (2006.01); G01R 31/00 (2006.01);
U.S. Cl.
CPC ...
G01N 27/02 (2013.01); G01N 27/026 (2013.01); G01R 15/146 (2013.01); G01N 22/00 (2013.01); G01R 29/0814 (2013.01); G01R 29/0878 (2013.01); G01R 31/002 (2013.01);
Abstract

A system and method for measuring the permittivity and/or the impedance of a material are based on transmitting a first RF signal to a transponder coupled to the material. The transponder is equipped with a resonant antenna coupled to the material such that the response of the antenna is affected by the material. The signal strength of a second RF signal transmitted by the transponder in response to the first RF signal, and received by an interrogator, is measured. The interrogator can calculate both the real part and the imaginary part of the complex impedance of the material from multiple measurements of the signal strength of the second RF signal taken at a plurality of frequencies of the first RF signal.


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