The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 16, 2018
Filed:
Mar. 24, 2015
Furukawa Electric Co., Ltd., Tokyo, JP;
Furukawa Electric Co., Ltd., Tokyo, JP;
Abstract
A screening apparatus includes a light permeable measurement chip having a well retaining a liquid including microparticles, a measuring section acquiring optical information of the microparticles obtained by illuminating the microparticles, an analyzing section that extracts optical information of the microparticles, a receiving plate receiving a microparticle selectively picked up from the measurement chip, a moving section moving the measurement chip and the receiving plate against the measuring section, and a collecting section for collecting a microparticle by sucking with the suction-ejection capillary and ejecting on the receiving plate. A distal-end outer dimension of the capillary is greater than a width of the well. The capillary sucks the target microparticle at a position where the distal end of the capillary and the measurement chip are spaced by a predetermined distance and a central axis of the distal end of the capillary and a central axis of the well are mutually displaced.