The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 16, 2018

Filed:

Mar. 03, 2017
Applicant:

Nhk Spring Co., Ltd., Yokohama-shi, Kanagawa, JP;

Inventor:

Mikio Arai, Kanagawa, JP;

Assignee:

NHK Spring Co., Ltd., Kanagawa, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 3/32 (2006.01); G11B 5/55 (2006.01); G11B 20/18 (2006.01); G11B 19/08 (2006.01); G11B 5/48 (2006.01);
U.S. Cl.
CPC ...
G01N 3/32 (2013.01); G01N 2203/0051 (2013.01); G01N 2203/0064 (2013.01); G11B 5/483 (2015.09); G11B 5/4826 (2013.01); G11B 5/4873 (2013.01); G11B 5/5552 (2013.01); G11B 19/08 (2013.01); G11B 20/1816 (2013.01);
Abstract

The present invention provides a method of surely detecting a crack in piezoelectric elements regardless of size of the crack. The method includes applying voltage to a first piezoelectric element of a pair of piezoelectric elements to cause deformation in the first piezoelectric element, forcibly deforming a second piezoelectric element of the pair of the piezoelectric elements to generate voltage from the second piezoelectric element according to the deformation of the first piezoelectric element, finding a transfer function of the pair of the piezoelectric elements based on values of the applied voltage and the generated voltage, and detecting presence or absence of a crack in the pair of the piezoelectric elements based on an objective value obtained from the found transfer function.


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