The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 16, 2018
Filed:
Jun. 21, 2016
Applicants:
Hyundai Motor Company, Seoul, KR;
Sm Instruments Co., Ltd., Daejeon, KR;
Inventors:
Assignees:
HYUNDAI MOTOR COMPANY, Seoul, KR;
SM INSTRUMENTS CO., LTD., Daejeon, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01M 17/007 (2006.01); G01M 17/00 (2006.01); G01H 13/00 (2006.01); G01H 3/08 (2006.01);
U.S. Cl.
CPC ...
G01M 17/007 (2013.01); G01H 3/08 (2013.01); G01H 13/00 (2013.01);
Abstract
An apparatus for measuring noise includes: a signal generator configured to input an input signal having an excitation frequency to an audio device; and a controller configured to measure rattle noise from a sound pressure signal generated in response to the input signal. The controller measures the rattle noise by comparing a frequency component of the sound pressure signal with a masking curve corresponding to the excitation frequency.
Quick Actions:
Lim, Kyoung. (2018). Apparatus and method for measuring noise (U.S. Patent No. 10101242). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10101242
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