The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 16, 2018
Filed:
Oct. 11, 2017
Tsinghua University, Beijing, CN;
Hon Hai Precision Industry Co., Ltd., New Taipei, TW;
Jun Zhu, Beijing, CN;
Tong Yang, Beijing, CN;
Xiao-Fei Wu, Beijing, CN;
Guo-Fan Jin, Beijing, CN;
Shou-Shan Fan, Beijing, CN;
Tsinghua University, Beijing, CN;
HON HAI PRECISION INDUSTRY CO., LTD., New Taipei, TW;
Abstract
An initial system and a constraint condition are established. All freeform surfaces are obtained by surface fitting the feature data points to form a first freeform surface imaging optical system. The first freeform surface imaging optical system is taken as the initial system for multiple iterations to obtain a second freeform surface imaging optical system. The second freeform surface imaging optical system is taken as a first base system. A first surface freedom of the first base system is selected, the values nearby the first surface freedom is selected, and surface positions and tilts of the first base system are changed to obtain a third freeform surface imaging optical system that satisfies the constraint condition. A second base system is selected and the method above is repeated. The freeform surface imaging optical system is obtained until all freedoms for surface positions and tilts have been used.