The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 16, 2018
Filed:
Feb. 10, 2017
Fuji Xerox Co., Ltd., Tokyo, JP;
Hiroyuki Hotta, Kanagawa, JP;
FUJI XEROX CO., LTD., Minato-ku, Tokyo, JP;
Abstract
An inspection apparatus includes a light emitting unit, a first lens, an aperture unit, a second lens, a light receiving unit, and an inspection unit. The light emitting unit emits irradiation light to an object to be inspected. The first lens changes a divergence level of the irradiation light which is emitted from the light emitting unit and is transmitted through the first lens. The aperture unit has an opening which narrows the irradiation light transmitted through the first lens. The second lens condenses the irradiation light passing through the opening, toward the object. The light receiving unit is disposed between the aperture unit and the second lens. The light receiving unit includes plural light receiving elements which receives reflected light obtained by the irradiation light being emitted to the object and then being transmitted through the second lens.