The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 16, 2018
Filed:
Jun. 07, 2013
Endress + Hauser Gmbh + Co. KG, Maulburg, DE;
Dirk Glaser, Steinen, DE;
Martin Urban, Lorrach, DE;
ENDRESS+HAUSER SE+CO.KG, Maulburg, DE;
Abstract
Radiometric measuring arrangement for measuring and/or monitoring a measured variable, especially a fill level or a density, of a fill substance located in a container and a method executable therewith for detection of accretion formation in the container. The variable to be measured is measured by means of a measuring system, which during operation sends radioactive radiation along a measuring path through the container, and measures radiation intensity emerging from the container along the measuring path, and by means of a comparison measuring system, which sends radioactive radiation along a comparison path through the container and measures radiation intensity emerging from the container along the comparison path. The comparison path extends in such a manner through the container that in the case of the presence of an accretion layer on the inner walls of the container a ratio of a sum of the two segments of the measuring path extending through the accretion layer to the length of an additional segment of the measuring path (A, A') extending between these two segments is different from the ratio formed in the same manner for the comparison path, and an accretion formation occurring in ongoing operation is detected based on deviations ascertained in ongoing operation between the measurement results of the measuring system and the measurement results of the comparison measuring system.