The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 16, 2018

Filed:

Jan. 09, 2017
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Kazuhito Akiyama, Machida, JP;

Mari Abe Fukuda, Tokyo, JP;

Sanehiro Furuichi, Tokyo, JP;

Hiroya Ogihara, Kawasaki, JP;

Taku Sasaki, Machida, JP;

Asuka Unno, Tokyo, JP;

Gaku Yamamoto, Machida, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01C 21/36 (2006.01); G01C 21/20 (2006.01);
U.S. Cl.
CPC ...
G01C 21/3694 (2013.01); G01C 21/20 (2013.01); G01C 21/3667 (2013.01);
Abstract

Phenomenon data for at least one moving phenomenon that affects travel on at least one roadway can be received. An impact distribution for the phenomenon over a plurality of phenomenon cells can be determined and corresponding phenomenon impact distribution data can be generated. For at least one vehicle, a plurality of candidate routes for the vehicle to reach an intended destination can be determined. For each candidate route, whether the candidate route intersects with at least phenomenon cell impacted by the phenomenon can be determined. If so, a vehicle simulation agent for that vehicle and that candidate route can be initialized. Using the vehicle simulation agent, an impact of the phenomenon on the vehicle can be determined based on the phenomenon impact distribution data. Data indicating the impact of the phenomenon on travel of the vehicle if the vehicle were to travel along the respective the route can be output.


Find Patent Forward Citations

Loading…